Depending on the conditions of the high and low temperature constant temperature test chamber

The humidity control high and low temperature constant temperature test chamber refers to a test chamber that releases temperature, environmental humidity, and stress together. With the demand for industrial product research and development in our country, a large number of overseas experimental system software have been introduced in recent years, fully leveraging the key role of industrial product research and development and molding in our country. However, due to its diversity, it has promoted many problems in the operation of the test box, which cannot be immediately dealt with, greatly increasing the experimental cycle time and endangering the product research and development work. The reason for this problem is the lack of knowledge of the principle of comprehensive experiments. A brief discussion was conducted on the basic principles of the test chamber, and a detailed introduction was given on how to analyze and distinguish common faults in the experimental equipment of the comprehensive test chamber.
 

The strictness of the constant humidity test chamber depends on the test temperature level and the length of the delay time. The relevant specifications should prioritize the following values:

1、 Constant humidity test chamber temperature test temperature.

Prioritize the following values: -63, -56. -50. -20, -12, -5.+5 ℃. The allowable error range for experimental temperature is ± 3 ℃.

2、 Delay time of constant humidity test chamber.

After the test temperature exceeds the stability limit, if necessary ultra-low temperature standard tests need to be conducted for a certain period of time, the following standards should be prioritized: 2.18.76, 98 hours. If the purpose of the test is only to check whether the test product can work normally at ultra-low temperatures, the test time is limited to making the temperature of the test product exceed stability; But in all cases, the delay time shall not be less than 40mln. When this specification is used as an experiment related to ultra-low temperature performance or reliability, the delay time required for the experiment is a relevant standard.